Development of High-Resolution Melting Curve Analysis for rapid detection of SEC23B gene mutation causing Congenital Dyserythropoietic Anemia type II in Indian population. - Physician's Weekly


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Development of High-Resolution Melting Curve Analysis for rapid detection of SEC23B gene mutation causing Congenital Dyserythropoietic Anemia type II in Indian population.

Jul 17, 2023

ABOUT THE CONTRIBUTORS

  • Arati Nandan Saptarshi

    Department of Haematogenetics, ICMR- National Institute of Immunohaematology, 13th Floor, New Multi Storeyed Building, KEM Hospital Campus, Parel, Mumbai, 400012, India.

    Rashmi K Dongerdiye

    Department of Haematogenetics, ICMR- National Institute of Immunohaematology, 13th Floor, New Multi Storeyed Building, KEM Hospital Campus, Parel, Mumbai, 400012, India.

    Tejashree Anil More

    Department of Haematogenetics, ICMR- National Institute of Immunohaematology, 13th Floor, New Multi Storeyed Building, KEM Hospital Campus, Parel, Mumbai, 400012, India.

    Prabhakar S Kedar

    Department of Haematogenetics, ICMR- National Institute of Immunohaematology, 13th Floor, New Multi Storeyed Building, KEM Hospital Campus, Parel, Mumbai, 400012, India. kedarps2002@yahoo.com.

REFERENCES & ADDITIONAL READING

PubMed

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